FDA Adverse Event Injury Summary report: N

IMHS CP ROUND IMPLAN

MDR report key: 2000408 · Received February 24, 2011

Report

Report Number
8010764-2011-00006
Event Type
Injury
Date Received
February 24, 2011
Date of Event
December 3, 2010
Report Date
February 24, 2011
Manufacturer
SMITH & NEPHEW ORTHOPAEDICS GERMANY
Product Code
JDS
Adverse Event
Yes
Report Source
Manufacturer report
Reporter Occupation
OTHER

Narratives

Additional Manufacturer Narrative · 1

FROM THE ANALYSIS CONDUCTED DURING THIS INVESTIGATION, IT WAS CONCLUDED THAT THE PROXIMAL PORTION OF THE IMHS CP NAIL FRACTURED BY THE INITIATION AND SUBSEQUENT PROPAGATION OF FATIGUE CRACKING. THE FATIGUE CRACKING EVENTUALLY PROPAGATED TO AN EXTENT THAT THE REMAINING CROSS-SECTIONAL AREA OF THE NAIL COULD NOT BEAR THE IMPOSED PATIENT LOADING, WHICH LEAD TO AN OVERLOAD FRACTURE. FATIGUE CRACKING IS CAUSED BY THE NAIL BEARING CYCLIC (I.E. REPEATED) STRESSES IN EXCESS OF THE MATERIAL ENDURANCE LIMIT FOR AN EXTENDED PERIOD OF TIME. THESE EXCESSIVE CYCLIC STRESSES MAY BE CAUSED BY ANY NUMBER OF CONDITIONS, INCLUDING BUT NOT LIMITED TO (1) EXCESSIVE PATIENT ACTIVITY LEVELS PRIOR TO FULL BONE UNION, (2) APPLICATIONS OF LOADS IN EXCESS OF THE MATERIAL'S STRENGTH, AND/OR (3) POOR BONE QUALITY. THERE WAS ALSO A FRACTURE NOTED AT THE DISTAL SLOT OF THE IMHS CP NAIL. SINCE THE FRACTURE DID NOT PROPAGATE THROUGH THE ENTIRE CROSS-SECTION OF THE DISTAL PORTION OF THE NAIL, NO ANALYSIS OF THE DISTAL FRACTURE SURFACE WAS POSSIBLE. NO MATERIAL OR MANUFACTURING DEVIATIONS WERE FOUND DURING THIS INVESTIGATION.

Description of Event or Problem · 1

REVISION SURGERY WAS REPORTED DUE TO BREAKAGE OF THE NAIL.

Devices

Seq Brand Generic Product Code Manufacturer Model Lot UDI-DI
1 IMHS CP ROUND IMPLAN IMHS CP 130 D 10 X 19.5L JDS SMITH & NEPHEW ORTHOPAEDICS GERMANY 71683010L 09LT37277

Patients

Seq Age Sex Outcome Treatment
1 58 YR Hospitalization| R (B)(4), LOT # UNKNOWN